Used AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 54810A #9201149 for sale

AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 54810A is an electronic test equipment designed for the development and testing of electronic circuits and systems. The device offers features such as waveform generation, frequency counting, analog switching, digital signal processing, pulse width modulation, and logic analysis. HP 54810A provides functions for analog and digital circuit testing, pulse waveform generation, phase-locked loop (PLL) testing, random noise measurements, transient measurements, and various other features for optimal testing. It features up to five digital inputs, including two-channel logic analyzer, dual eight-band swept-frequency generator, two-channel analog waveform generator, and 2-channel arbitrary waveform generator. Furthermore, it has a high-accuracy clock oscillator and multiple trigger inputs for multi-channel trigger system measurement control. AGILENT 54810A also features a 10-bit analog-to-digital (A/D) converter, enabling the device to accurately capture and analyze a wide range of signals. The 5-bit data acquisition system supports a maximum sampling rate of 160 MS/s for a single channel, allowing for capturing wideband signals for signal-dependent measurements. Furthermore, HEWLETT-PACKARD 54810A includes an on-board 400 MHz spectrum analyzer with a wide dynamic range. This feature is used for examining the coordination and response of electronic circuits. KEYSIGHT 54810A provides a user-friendly interface that includes a 3.5" color display and a rotary/push knob. The simply-structured graphical interface allows users to access sophisticated instrument functions with ease. The 54810-A also features automatic setup and autocalibration, which is an essential feature for improving system performance and accuracy. The device also features various connectivity options such as GPIB, USB, and Remote GPIB Protocol (RGP). All these features provide the user with a powerful and reliable instrument for advanced test and measurement performance.