Used AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 81150A #9200003 for sale

AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 81150A
ID: 9200003
Power meter Option: 002.
AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 81150A combination signal generator/pulse pattern generator is an electronic test equipment designed to accurately generate timing and triggering signals to test digital and analog electronic circuits. This signal generator and pulse pattern generator provides RF and microwave signals with arbitrary waveforms and modulation types, including AM, PM, FM, and pulse modulation features. It also provides small-step linear sweeps and frequency list sweeps, a unique "Channel-Hopping" feature, and precise frequency-locking capability. HP 81150A's triggering capabilities include pulse train non-return-to-zero (NTRZ) and rectangular waveforms, with adjustable duty cycles. It also has an external trigger input that allows for synchronized triggering and signal switching for multiple channels. The signal source provides high signal purity with low jitter, harmonic distortion, and low additive noise. It also offers exceptionally low spurious signal levels and low phase noise levels. AGILENT 81150A has a large LCD, numeric keypad, and tactile softkeys that allow the user to quickly and accurately configure signal configurations. It provides flexible output connections supporting both 50Ohm and 1MegOhm loads. It also offers an accessory slot for use with external amplifiers, amplifiers, and filters. 81150A also offers a built-in processor which allows the user to store and reproduce signal configurations for fast and easy recall. Other features include PC-based data transfer and storage, manual and automatic waveform upload capabilities, and an optional GPIB interface. Overall, HEWLETT-PACKARD 81150A combination signal generator/pulse pattern generator is an ideal tool for both design validation and production testing. Its combination of excellent signal purity, flexible triggering, and PC-based data capabilities make it suitable for a variety of test applications.
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