Used AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 85033C #108078 for sale

AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 85033C
ID: 108078
Calibration kit, 3.5 mm.
AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 85033C is an electronic test equipment designed to measure the impedance, inductance and capacitance, as well as other electrical parameters, of all variety of RF and microwave circuits. HP 85033C covers a frequency range from 10 MHz to 67 GHz and is suited for testing a wide range of applications, from RF components to embedded high-speed transmission designs. This electronic test equipment features a one-button operation, making it incredibly easy to use. AGILENT 85033C can measure complex impedance and admittance parameters accurately, allowing accurate characterisation of the examined circuit. It features a frequency range of 0.01 Hz to 67 GHz, and applies a voltage up to 10 V peak-to-peak (2.5 V average, depending on the frequency). HEWLETT-PACKARD 85033C also offers true time-domain reflectometry (TDR) and 2-port Vector Network Analysis capability, to evaluate high-frequency components accurately. KEYSIGHT 85033C uses an internal 6.5 digit digital multimeter for DC testing, for accurate determination of voltage and resistance up to 200 V. This instrument also comes with a variety of probe designs, for added flexibility and convenience of use. The step function generator makes it possible to accurately characterise high-speed components and digital transmission systems, up to 25 GS/s and frequencies of up to 66.7 GHz. The software supplied with 85033C allows users to **control the instrument** and data storage in the extended analysis capabilities. Accredited software is also available, offering added assurance of accuracy and compliance with standard safety regulations. AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 85033C is the perfect and versatile tool for testing and characterisation of high-speed circuits and interconnects. Its robust design and full range of features makes it a great tool for any laboratory or test facility.
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