Used AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 8510 #9086901 for sale

AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 8510
ID: 9086901
Network analyzer.
AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 8510 is a highly advanced electronic test equipment designed specifically for RF component measurement and analysis in the laboratory. The design is based on the latest digital technology, and it is equipped with many features that make it ideal for sophisticated and highly accurate test and measurement tasks. HP 8510 is equipped with a highly sensitive receiver and signal conditioning components, which allow the user to make precise measurements and analysis tasks. It includes an AM, CW, and noise receiver, enabling the user to measure the noise floor as well as various signal levels. It is also equipped with an internal sampler, and precision digital readouts, allowing for highly precise readings to be taken. AGILENT 8510 also has a wide variety of testing capabilities, including wideband swept tests, frequency response cycles, transmission loss, signal to noise ratio, and much more. It is also capable of performing frequency and radar sweeps, a key feature for determining radio frequency interference (RFI). The large display screen, and two built-in digital output ports, allow for easy connection to in-house computer systems. 8510 uses reliable standards for testing, such as the ISO/IEC 1990 or the IEEE 802.11b-2020. It is a highly accurate test equipment as well, with a +/- 1 dB accuracy. It is also designed with safety in mind, protecting users from accidental overloads and power surges, and featuring a high-impedance protection circuitry. Overall, HEWLETT-PACKARD 8510 is an invaluable tool for any laboratory that is involved in research and development of RF systems, or components. With its state-of-the-art digital technology, built-in testing capabilities, and safety measures, KEYSIGHT 8510 allows users to make highly accurate measurements and analyses. It is an all-in-one testing solution for laboratories involved in RF measurement and analysis.
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