Used AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 85133F #9169869 for sale

AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 85133F is an electronic testing equipment that is used to measure the electrical characteristics of semiconductor devices such as transistors, capacitors, resistors, diodes, and integrated circuits. HP 85133F is a full featured device tester, offering the capability to test a wide range of semiconductor parameters, including but not limited to current, voltage, resistance, capacitance, transconductance, and breakdown voltage. The instrument also offers a range of software features such as data logging, test sequencing automation, and curve-tracing. AGILENT 85133F consists of an integrated interface/tester module, a power supply, and an oscilloscope. The interface/tester module offers a variety of features, including adjustable voltage and current sources with programmable ranges, and digital output registers for controlling device testing via a computer. It also offers a built-in digital voltmeter, current meter, and ohmmeter. The oscilloscope comprises two unique instruments, the main oscilloscope and the probes. The main oscilloscope is capable of displaying waveforms at up to 500MHz and is capable of viewing both analog and digital signals. The probes provide positioning, voltage, and current measurement capabilities. 85133F offers excellent diagnostic capabilities, enabling the user to visualize the characteristics of the device being tested. This powerful tester has an adjustable offset null, capable of measuring to 10μV. It also has an adjustable time-domain response and resolution of 500 MHz. This allows the user to measure the rise and fall times of the signal in various signal propagation speeds. Additionally, with the advanced programming capabilities, the user can create custom curve-tracing signals for changing parameters at specific times. HEWLETT-PACKARD 85133F tester also features thermal measurement capabilities, automated gpib interface, and built-in high voltage protection. The thermal measurement feature enables the user to measure the temperature of semiconductor devices by using an in-built thermoprobe. In case of overvoltage protection, the instrument will shut down the equipment should it exceed the preset voltage limit, preventing damage to the testing equipment and the device under test. It also has a built-in GPIB interface, allowing the user to easily connect the device to a PC. In conclusion, KEYSIGHT 85133F is a versatile and powerful tester capable of testing a wide range of semiconductor devices. Its extensive feature set allows the user to accurately measure a variety of electrical characteristics, such as current, voltage, and capacitance. Additionally, the built-in safety features and GPIB interface provide added value to this testing device.