Used AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 8563EC #293671740 for sale
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AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 8563EC is a state-of-the-art electronic test equipment designed for high performance signal analysis. It has a wide range of capabilities, from signal generation to spectrum and modulation analysis, allowing for a full assessment of a wide variety of signals and systems. HP 8563EC is a core element of electronic system development, allowing engineers to accurately measure and analyze signals and systems for signal integrity, distortion, noise, throughput, etc. It is built with a high-speed 10GHz measurement bandwidth, providing an incredible level of sensitivity and dynamic range for a wide variety of signal types. AGILENT 8563EC offers advanced measurement features such as noise figure, modulation analysis and frequency response. It also provides amplitude, phase, and frequency sweep sweeps with an internal signal generator, allowing for easy characterization or calibration of other circuits. It has a rich and intuitive graphical user interface, allowing the user to quickly acquire and analyze data. KEYSIGHT 8563EC has an excellent directivity gain of 12.5dB. With it's unique rugged yet elegant design, the unit is durable and able to handle a wide range of environmental conditions. It also has a short preamble noise-level measurement duration of 6µs, allowing for very quick turnaround times on measurements. 8563EC is designed for use by research organizations, development operation centers, universities, and manufacturing industries. It is able to provide a high precision and accuracy for a wide range of signal types. This makes it ideal for a variety of test and measurement environments. Overall, HEWLETT-PACKARD 8563EC is an excellent test equipment requiring minimal efforts during installation and operation. It provides a compact design, intuitive user interface and advanced features. AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 8563EC is a great choice for a variety of needs and applications. It can be used to evaluate performance of advanced communication systems, semiconductor devices, and other electrical components. Large excitation levels and wide measurement bandwidths allow for a detailed view into a wide variety of signal in various testing and measurement scenarios.
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