Used AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 8714C #9177490 for sale
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AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 8714C is a high performance vector network analyzer (VNA) providing precise and accurate measurements of amplitude and phase characteristics of two port networks from 10 Hz up to 50 GHz. This network analyzer is used for the characterization of microwave devices, components, and circuits, such as filters, amplifiers, and antennas. HP 8714C features a compact and lightweight design weighing only between 12 and 15.6 kilograms, depending on the version. This makes it easy to transport and set up when needed. AGILENT 8714C also features wide measurement ranges from 0.001 dB to 118 dB in reflection and 0.002 dB to 118 dB in transmission. Additionally, 8714C delivers a dynamic range of up to 153 dB when used with the NNG-100 noise figure option. KEYSIGHT 8714C includes advanced calibration techniques to ensure accuracy and reduce measurement errors. These include both one- and two-port calibration procedures, including SOLT (short, open, load, thru) and TRL (through, reflection, line). Additionally, HEWLETT-PACKARD 8714C is equipped with a 6.1-inch color touch-screen display, which provides data visualization through a variety of chart types, such as Smith charts, line displays, and polar charts. AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 8714C also includes various communication and output options, including a parallel printer port, dual USB ports, and an GPIB interface. These allow for the transfer of data and measurement results to external systems, as well as control and monitoring of the VNA. Additionally, HP 8714C comes with several built-in analysis and measurement routines, such as time-domain analysis, phase-noise measurements, and impedance measurements. Overall, AGILENT 8714C is a high performance vector network analyzer that delivers precise and accurate measurements. It comes with advanced calibration techniques, a touch screen display, and various output and communication options, making it an ideal choice for characterizing and making measurements of microwave devices, components, and circuits.
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