Used AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 8743B #9111151 for sale

AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 8743B electronic test equipment is designed for high-frequency and multi-site tests. It can be used for rapid prototyping and is ideal for device characterization. HP 8743B has a maximum frequency of 1GHz when operating in single-site mode, and it supports 2GHz when operating in multi-site mode. It can measure a wide range of parameters, including low-level DC voltage, low-level DC current, and resistance. AGILENT 8743B provides a high-performance frequency counter measuring up to 2GHz with an accuracy of ±3ppm. It also has a fast sweep mode that can measure frequency down to 10Hz. The internal source can generate a stable and low noise signal up to 1GHz, with settings for power, frequency, level, and waveform. It also includes an adjustable power meter, power sweep, and frequency sweep modes. HEWLETT-PACKARD 8743B features a wide array of digital and analog I/O, including Ethernet, RS-232, GPIB, USB, and analog inputs and outputs. It also has user-programmable arbitration features that let you define parameter limits and fail conditions. KEYSIGHT 8743B integrates with many of the industry-standard vector network analyzers, making it easy to develop and debug complex tests. It is also compatible with the industry-standard MATLAB software, allowing for custom debugging and instrument control. 8743B includes numerous capabilities that make automated testing easier. For example, it has an easily-configurable ramp generator, which includes settings for time and voltage. It also has Auto-Log and Auto-Measure features designed to streamline the data collection process. Additionally, AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 8743B can store data from multiple tests in memory and export that data to various file formats, including Microsoft Excel. In conclusion, HP 8743B is an excellent choice for measuring a wide range of parameters. It has a robust set of features designed for high-frequency and multi-site tests, fast sweep modes, digital and analog I/O options, and automated testing capabilities. It is ideal for rapid prototyping and device characterization.