Used AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 8753ES #183202 for sale

AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 8753ES is a high performance, RF/microwave network analyzer designed for both laboratory testing and field-testing in a wide range of applications. It features around 1.4MHz frequency range, 1kHz to 3GHz maximum dynamic range and a maximum dynamic accuracy of a minimum of 0.25 dB. Ideal for research laboratories, educational establishments and telecommunications, HP 8753ES offers a fast and accurate platform for testing a variety of RF and microwave devices. AGILENT 8753ES provides an extensive range of capabilities and components, providing efficient measurements and accurate, reliable results. Its all-optional design basically consists of an RF/microwave source, two test ports and an additional source-receiver analyzer. This enables full two-port measurements as well as one-port measurements like scalar measurements, gain compression, harmonic and pulsed IV curves. This network analyzer is ready to use right out-of-the-box and provides a range of configuration options to meet individual user requirements. It has intuitive transport keys, and a 7-inch color touchscreen display with five interactive menus that provide quick access to measurement modes and settings. It also features an on-screen help system that offers context-sensitive help on the functions and features of the unit. The built-in measurement memory module allows the user to store and recall results for analysis and also allows for remote control. The test set features a GPIB connector for remote PC control, so that it can be used as a standalone instrument or connected to a computer for data acquisition. 8753ES has a wide range of performance characteristics, all backed up by a comprehensive selection of accessories and an extensive range of support and service offerings, making it an invaluable workhorse when conducting R&D and related operations. Its excellent dynamic range, speed of operation and range of capabilities make it ideal for high-precision measurements of virtually any device or system.