Used AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 8753ES #9166822 for sale

AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 8753ES
ID: 9166822
Network analyzer 6 Ghz 75 Ohm.
AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 8753ES is an electronic test equipment designed to offer superior accuracy and dependability in a variety of testing environments. This high-end system is used by engineers and scientists to accurately measure electrical parameters on small- or medium-sized components and circuits. HP 8753ES is ideal for testing devices such as antennas, capacitors, inductors, and resistors. A variety of test accents, probes, and cables are pre-configured and pre-installed to provide comprehensive test capabilities. These include an AC current probe (for measuring current in components), a dc current probe (for measuring static current, DC offset voltage or AC voltage), and an RF probe (for measuring resistance, reactance, and dielectric constants). AGILENT 8753ES offers precise time-domain analysis capabilities to measure impedance, pulse-reversal, frequency-selective, and fast-time domain parameters. A built-in time-domain deformulator is included to recognize and eliminate signal distortion and jitter. The optional Markers and Trigger functions help to pick up transient signals quickly and accurately. HEWLETT-PACKARD 8753ES provides a wide range of signal sources and synthesizers that can generate sine, square, and rectangular waveforms. It also has easy-to-use color touchscreen interface and powerful graphical display that allow users to quickly assess and analyse their results. Built to withstand shock and vibration, 8753ES is also highly reliable. Many of its components are RoHS compliant and its unit's stability is measured in terms of rack-mountability and storage. Overall, KEYSIGHT 8753ES is a powerful, versatile, and versatile electronic test machine that provides users with a vast array of testing capabilities. With its precisely controllable parameters and reliable performance, this advanced tool is capable of handling the most demanding test scenarios.
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