Used AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 8757D #9220817 for sale

AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 8757D is an electronic test equipment designed to measure and test components, circuits, and systems. It is comprised of several modules that offer a wide range of capabilities such as RF (Radio Frequency) and microwave frequency measurement, impedance measurement, noise figure measurement, pulse/timing waveforms, AC/DC voltages, plus digital I/O and other features. HP 8757D is also capable of performing high-speed digital measurements with accuracy for a variety of applications. The instrument features low-phase noise, high dynamic range, fast measurement response time, and low noise to provide reliable and accurate results. The front panel of AGILENT 8757D provides intuitive user interface and step-by-step testing procedures to ease operation. 8757D comes with dedicated RF input and output ports. It also includes a built-in power supply for providing power to the RF measurement circuits and digital control interface for communication with the computer. The integrated waveform generator allows users to create pulse and timing waveforms for operation testing. It offers excellent dynamic range, high measurement accuracy, and fast response time to develop reliable measurement results. HEWLETT-PACKARD 8757D comes with a variety of features to optimize and speed up testing. The programmable automated test system (PATS) provides a powerful automation. It facilitates the user to automate processes such as test sequences, data acquisitions and report generation. The instrument also features interactive real-time signal analysis and automated signal display, allowing users to observe signal variation in a single number and figure out the cause of signal failures quickly. KEYSIGHT 8757D is perfect for development and troubleshooting of high speed digital circuits and systems for telecom, industrial and research applications. The instrument is ideal for applications such as RF measurements, pulse generating and measuring, frequency response analysis, impedance analysis, noise analysis and other related measurements. It is an ideal choice for testing high speed digital devices and systems.