Used AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 8991A #9263843 for sale
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AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 8991A is an electronic test equipment that is widely used in the semiconductor industry. It is an automatic test system with multiple GPIB ports, making it suitable for troubleshooting complex systems. This equipment provides a total test solution for wafer probing, device characterization, semiconductor device burn-in and reliability testing, and much more. HP 8991A is the successor to HP 8970A and is designed to test both DC characteristics (Pulsed Output Test, Voltage Output Test, and Transconductance Test) and AC characteristics (AC Output Test). It includes a wide range of modules, such as an adjustable power supply with independent digital device control, variable test signal generators, and various interfacing boards. This device also provides multiple levels of automation to minimize manual intervention and improve the accuracy of the testing process. This system is specifically designed to be used in high-speed device characterization and failure analysis. It has four independent adjustable sources with a wide range of voltage control options and variable speed outputs. The integrated pulse generator can generate signals up to 1MHz and is suitable for testing high-speed semiconductor devices. It also offers an adjustable voltage bias of up to 6V, making it suitable for various types of wafer probing and burn-in applications. AGILENT 8991A also features an integrated digital device control, enabling automated and repeatable test procedures. This function also provides data logging facilities that are essential for failure analysis purposes. It also features a software environment compatible with many diagnostic and control languages, such as C, AGILENT-Pascal, KEYSIGHT-BASIC, and more. The system is highly scalable and expandable, making it suitable for prototyping and production-level testing. 8991A is a reliable and cost-effective solution for DC and AC device testing. It is also capable of analyzing a variety of test parameters, such as junction Capacitance, Leakage Current, Temperature Cycle, Leakage Current endurance, and more, enabling quick and accurate device characterization. With its flexible test configuration, HEWLETT-PACKARD 8991A is suitable for a variety of test scenarios and is an essential tool for any semiconductor lab.
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