Used AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT B1505A #293598097 for sale

AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT B1505A
ID: 293598097
Semiconductor device analyzer.
AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT B1505A is an electronic test equipment which is specifically designed for precision measurements of high-speed signals. It is contemporary, lightweight, has small size, and is incredibly efficient and reliable. HP B1505A combines a high-performance 2-port source measure unit (SMU) with remote sensing technology for top accuracy. It includes various innovative integrated device test functions including source, voltage, and current measurements. The output of this device can reach up to 20V/20A, allowing it to test a wide range of electronic devices. The device features a 6GHz oscilloscope, which ensures higher frequency measurements, higher data acquisition rates, and pulse shaping capabilities. Furthermore, AGILENT B1505A is equipped with Time Domain Reflectometry (TDR) measurement electronics, which helps to build contactless, direct, and differential measurements with accuracy. The device allows users to perform tests and measurements directly on their devices with consistent accuracy without the need to remove them from their assemblies. It also provides comprehensive device characterization features, such as automatic de-embedding, parametric analysis and model extraction of device performance. B1505A is easily operated but can provide accurate and repeatable results. Its user interface is intuitive, including a 100kHz bandwidth, programmable security settings, alarm system, FFT display, D/A converter, source limiter, and a multi-stage calibration for extra safety. The device also includes a 50kHz generator, a step generator, a Digital I/O, and arbitrary waveforms. HEWLETT-PACKARD B1505A is an ideal choice for making repeatable, reliable, and accurate measurements. It is designed to provide users with easy to use and efficient measurements while also offering unprecedented accuracy. This helps users to make faster tests and measurements as well as to obtain comprehensive results in less time.
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