Used AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT DSO81304B #9219019 for sale

AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT DSO81304B is an electronic test equipment designed for benchtop digital data acquisition applications. This device has a unique 3-slot architecture, making it possible to configure it as an oscilloscope, logic analyzer, or spectrum analyzer to fulfill the user's testing needs. It is a single-shot, dual-channel capability that can operate up to 300 MHz. It can capture up to 500,000 samples/second to provide superior waveform acquisition and signal characterization. HP DSO81304B has a 4.3-inch TFT color display for clear waveform display, an intuitive front panel for easy operation, and a complex triggering system to ensure data capture of short and elusive signals. Among its key features are its high sample rate of up to 500 MS/s, deep waveform memory of up to 4M points, 7-bit vertical resolution (256 distinct vertical levels) as well as a the standard 10-turn vertical attenuator offering 1 MOhm/50 pF input channels. In addition, it offers advanced math functions such as FFTs and histograms as well as multiple cursors and user defined parameters. AGILENT DSO81304B offers expandability through a broad range of plug-in modules such as the waveform acquisition simulator, digital pattern generator, parallel data logger, and protocol analyzer. It is also equipped with HP Data Acquisition, Storage, and Analysis System (KDSAS) software allowing users access to sophisticated data acquisition and processing functions. It comes with a rugged, lightweight housing that is compact and portable. HEWLETT-PACKARD DSO81304B is a highly configurable and reliable testing solution that is ideal for engineers and researchers requiring an accurate and efficient instrument for digital data acquisition. Its versatile design and wide range of features make it well suited for various applications such as research and development, production test and troubleshooting of digital circuits, design and verification of digital systems, characterizing digital logical elements, and testing and interfacing with embedded systems.