Used AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT E2675A #9167409 for sale

AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT E2675A electronic test equipment is a high speed, high bandwidth, microwave down converter. It is designed for use in a wide range of applications such as in-circuit testing, RF testing, communications testing, and general-purpose testing. HP E2675A down converter is designed for up to 40 GHz frequency range. It features an extremely high sensitivity and low noise performance. AGILENT E2675A is a 1.8 to 2.4 GHz wideband down converter which translates microwave signals to a lower frequency range. It has an automatic level control, allowing users to set the degradation control level of the signal to be measured. This helps preserve signal integrity and accuracy during testing. E2675A also features low distortion, wide temperature range, and high input power. KEYSIGHT E2675A offers excellent signal fidelity and noise performance. Its low noise figure allows for accurate measurements at low harmonics. The high-speed sampling rate enables the device to capture the full range of the signal being tested, including transients or very fast changes in signal. Additionally, HEWLETT-PACKARD E2675A features best-in-class analyzer specifications to help you accurately characterize the signal. AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT E2675A supports a wide variety of connector types, such as SMA, N, and others. This ensures that the unit can be easily integrated into any test environment. The unit is also capable of supporting a wide range of signal modulation frequencies. This feature makes HP E2675A ideal for complex communication tests. Overall, AGILENT E2675A is an advanced, high-performance test equipment that is suitable for a variety of applications. It offers wide frequency range, high sensitivity, low distortion, and low noise performance. The unit's various features make it ideal for a wide variety of signal measurement needs. In addition, the unit is capable of supporting a wide variety of connectors, making it easily compatible with multiple test environments.