Used AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT E4419B #200626 for sale

AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT E4419B
ID: 200626
Power meter Comes with cables.
AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT E4419B is a high-performance electronic test equipment which is capable of fulfilling various measurement needs in both R&D and production. It features an intuitive touchscreen and easy to use operating system to ensure smooth operation and allows users to conveniently measure AC, DC, and impedance parameters. HP E4419B is powered by a high performance processor and upgradable operating system, making it an ideal choice for testing various components and devices. It has two input channels (CH1 and CH2), each with an independent analog-to-digital converter supporting up to 5 MHz sample rate as well as 4 GSa/s scan rate. It can measure up to 450 MHz bandwidth frequency, making it an excellent tool for testing high-frequency components and devices. Additionally, it can perform measurements up to 10V RMS/ 20V peak-to-peak. AGILENT E4419B is also equipped with an isolated degauss port and Pulse Generator Module to help accurately measure various waveforms at a wide range of frequencies. It also comes with an impedance measurement function, allowing it to measure complex networks, discrete components, and systems up to 8,400 ohms. Other features of HEWLETT-PACKARD E4419B include six types of memory, pre-programmed measurement setups, and a Print/Save function which allows users to easily print out their result or save them to a USB drive. It also comes with multiple built-in signal generators for waveform loading and testing. To ensure the best performance of KEYSIGHT E4419B, it should be properly calibrated at regular intervals. E4419B is able to handle tough tasks in a wide range of applications, such as component testing, device characterization measurements, and waveform measurements. With its intuitive user interface and robust features, AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT E4419B is an excellent choice for test and development.
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