Used AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT E4436B #9166989 for sale

AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT E4436B is a reliable and versatile electronic test equipment used for measuring and testing electrical signals in a wide range of applications. This spectrum analyzer is designed to assist in RF and microwave measurements, making it an ideal tool for engineers in R & D. HP E4436B offers a wide range of capabilities including basic spectrum analysis, signal or interference analysis, and more. It is equipped with an input frequency range up to 26.5 GHz. The displayed average noise level (DANL) is -171 dBm/Hz at 1 GHz and offers a wide range of sensitivity selections, making it suitable for measuring signals in the low microvolt (µV) range. This sensitivity is provided with a high dynamic range of up to 139 dB, providing accurate measurements of signal levels regardless of the signal type. AGILENT E4436B also offers features such as selectivity and advanced triggering, allowing users to accurately isolate and analyze signals of interest. The built-in digital resolution bandwidth filters can also be used to reduce noise and undesired signals which can interfere with the measurement. Additionally, the measurement accuracy is further improved by the use of power and single-sideband reference signals. KEYSIGHT E4436B also includes advanced digital signal processing (DSP) which increases its versatility for task-specific measurements. Using the DSP, users can perform complex MIMO measurements, eliminate unwanted noise with notch filters, and make use of automated features, such as a phase-locked loop magnitude tracking algorithm, to accurately measure and track signals. Overall, E4436B is a reliable and versatile electronic test equipment suitable for a wide range of applications. Its wide range of features, such as wide input frequency range, high sensitivity and dynamic range, selectivity and advanced triggering options, as well as DSP technology, allow it to accurately measure and analyze signals in a variety of complex measurement scenarios.