Used AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT E4440A #9000649 for sale

AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT E4440A is an electronic test equipment designed for measuring the RF, microwave, and digital signals. HP E4440A includes a variety of features designed for high precision, repeatability, and efficiency, and allows for an extensive range of measurements. AGILENT E 4440A is a Spectrum Analyzer that offers many features designed to make measurements and measurement analysis easier. It is an agile, high-speed instrument capable of quickly and accurately measuring RF, microwave, and digital signals in wideband applications. HEWLETT-PACKARD E 4440A has two separate frequency ranges, allowing it to measure signals over a broad frequency range. It can measure signals from 9KHz to 6.2GHz or 7GHz, depending on the model chosen. The spectrum analyzer also offers a multitude of analysis measurements such as ToF (Time-of-Flight), Noise Figure, IP3, and Power in an easy to understand graphical format. HEWLETT-PACKARD E4440A is designed with an intuitive user interface that can quickly be tailored to the tasks at hand. The instrument has a number of display options that can be tailored to the spectrum of signals chosen, enabling analysis on more than just single signals. The device is also capable of dual channel measurements, giving you the ability to compare signals from two different sources simultaneously. AGILENT E4440A can save time in both setup and data collection, with automated test runs and data storage capabilities. An internal storage memory of 6MB gives the ability to store up to 6M of measurement data internally. E 4440A also provides more precise testing capabilities than traditional spectrum analyzers. With its high resolution, KEYSIGHT E 4440A allows for precise measurements over wide bandwidths; this feature gives the ability to measure small changes and signals precisely. Overall, KEYSIGHT E4440A is a reliable and accurate electronic test equipment designed for RF, microwave, and digital signal measurements.