Used AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT E4443A #9017005 for sale

AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT E4443A
ID: 9017005
Signal generators 3 Hz - 6.7 GHz Includes options: B7J, 202, 226.
AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT E4443A is a wideband signal analyzer used for testing the frequency response of electronic components and systems. It has a frequency range from 9 kHz to 26.5 GHz and the input power range spans from -62dBm to +20dBm of average power. The Signal analyzer utilizes a 3rd-order intermodulation distortion (IP3) with a total dynamic range of over 70dB. The analyzer also features a Fast Fourier Transform (FFT) capability for plotting broadband spectrum analysis. Additionally, a wide variety of external mixers, couplers, amplifiers, and other test accessories can easily be connected for more expansive performance capabilities. HP E4443A has an enhanced signal processing capability that allows users to benefit from increased measurement speed, accuracy, and flexibility. It utilizes a highly repeatable and stable phase-sensitive measurement system, allowing for accuracy within 0.15dB. It can measure frequency response and gain flatness, pulse characteristics, frequency hopping, and much more. Additionally, it features a multi-domain display that provides an easy-to-view, comprehensive display of both the frequency and time domains. With its connectivity flexibility, users can enjoy the added benefits of remote PC programming and control. AGILENT E4443A is compatible with both the industry standard SCPI (Standard Commands for Programmable Instruments) as well as HP-IB/IEEE 488.2 protocols, giving the users control of the analyzer from a PC. This allows for increased automation, measurement monitoring, and data manipulation of the test setup and results. HEWLETT-PACKARD E4443A is a powerful tool for any engineering laboratory that needs wideband spectrum analysis capabilities. Its vast frequency range, dynamic input power range, and enhanced signal processing capabilities make it ideal for testing a wide variety of electronic components and systems.
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