Used AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT E4445A #9112964 for sale

AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT E4445A is a high-performance vector network analyzer. It is designed for lab/R&D and component/module characterization applications in the frequency domain between 1 MHz and 1100 MHz. This powerful vector network analyzer features an internal noise floor of -140 dBm, a dynamic range of 80 dB, and frequency sweep speeds as fast as 35 μs/span. It also supports up to 5 multiple measurements at a time with 16-bit dynamic range and an uplink/downlink Hz/sec speed that can reach as high as 30G. HP E4445A is an excellent instrument for measuring complex networks, such as filter and antenna designs. With its wide frequency range, it can be used in a wide range of industries such as RF/microwave, communications, aerospace/defense, automotive, and medical. Additionally, it provides users with a variety of advanced features, including phase and magnitude calibration, VSWR correction, converting S-parameters, convert loss to gain, time-domain measurements, gain compression and flatness, and DFT power spectrum measurements. AGILENT E4445A is a highly configurable, user-friendly instrument. It features a 10.4" TFT LCD display, dual-DVM, a wide range of RF/inter-digital ports, a mouse, and a keyboard. By using the built-in "Help Desk" system, users can obtain up-to-date information, and they can also write their own programs for specific applications. HEWLETT-PACKARD E4445A is also equipped with the PNA-Link software, which allows users to remotely control their KEYSIGHT E4445A instrument from a PC. E4445A is a high-performance instrument with a range of features and capabilities. It is an excellent choice for those who are looking for an all-in-one vector network analyzer. It is rugged, reliable, and is designed for maximum accuracy and flexibility. If you are looking for a reliable and powerful instrument, AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT E4445A is a great option for your lab/R&D and component/module characterization applications.