Used AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT E4447A #9219395 for sale

AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT E4447A is an electronic test equipment designed for accurate, repeatable and reliable testing. It is a general purpose analyzer for time and frequency domain measurements, such as frequency response, rise time, fall time, group delay, phase noise, impulse response, transferred jitter, cross-correlation and other applications. HP E4447A is a modular test equipment that features a waveform synthesizer, pulse generator and analyzer for time and frequency domain measurements. It offers fast and accurate characterization over a wide dynamic range with its true wideband synthesizer. The waveform synthesizer uses a True-Mode analysis to ensure accurate waveform measurements with high dynamic range. It has an adjustable output power level of up to 20dBm, with an input range of -119 to + 9dBm, allowing for a wide range of testing options. The pulse generator is designed to provide accurate, reliable, repeatable and repeatable pulse signals with a pulse width of up to 78.2ns, programmable pulse widths. It also has an adjustable pulse jitter starting from 0ps, with a jitter extending to 880ps. The pulse generator offers a high resolution in frequency domain measurements and is suitable for precision tests. AGILENT E4447A also features a Frequency Response Analyzer (FRA) to measure vibration and frequency response characteristics. This analyzer can measure up to 1.6GHz, with a range of 13db, with adjustable low and high pass filters and a range of frequency sweeps for precise tuning. In addition to its test capabilities, E4447A also features a variety of data management and control functions such as data logging, remote control, and web-based control. The unit is equipped with multiple GPIB and Ethernet ports, allowing it to be easily connected to other equipment or integrated into a data acquisition system. HEWLETT-PACKARD E4447A is an excellent choice for reliable test and characterization of dynamic performance over a wide frequency range. It is capable of providing high resolution frequency domain measurements for precision optimization of electronic components and systems. Its modular design and integration with other test and control equipment makes it suitable for use in research, development, and production environments.