Used AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT E5062A #9021130 for sale

AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT E5062A is an electronic test equipment designed for the characterisation of RF and microwave devices under dynamic conditions. Its features include harmonic measurement, amplitude modulation signal generation, linear vector modulation, and vector signal analysis. HP E5062A is a two-channel vector network analyser (VNA) with a range of 5MHz to 6GHz and a frequency accuracy of ±0.1 parts-per-million (ppm). It has a resolution of 0.041 dB, a minimum dynamic range of 114 dB, a 1:2.5 directivity of up to 10GHz, and an error < 1 dB up to 20GHz. AGILENT E5062A has a built-in harmonic measurement and spectrum analyzer with an intrinsic wide dynamic range for accurate, non-dynamically compressed, harmonic measurements. It offers 128 harmonic points, up to 1GHz bandwidth, and up to 40GHz frequency coverage in a single sweep. In addition, it has a 90-degree phase and group delay scan feature with a minimum 1.8dB minimum resolution. It offers a wide range of amplitude modulation (AM) signal generation capabilities to enable complex AM signal measurement and analysis. This includes a linear vector modulation (LVM) mode with presets for simultaneous amplitude and phase modulation, as well as a vector signal analysis (VSA) mode, which provides a variety of analysis functions such as FFT, vector modulated signals, and limit testing. E5062A also features an internal computer with a web interface for setup and control, as well as an embedded serial port for LAN/USB connections, allowing for remote operation from a PC or laptop. In addition to its testing capabilities, HEWLETT-PACKARD E5062A features excellent safety features, including over-current and over-voltage protection, as well as full compliance with the IEC61000-4-2 DO-160G ESD. It is also RoHS compliant and has removable dust filters. KEYSIGHT E5062A is an ideal tool for any laboratory engaged in the development and characterization of RF and microwave components and devices. It provides the testing accuracy, speed, and flexibility required to quickly and easily verify the performance of the device under dynamic conditions.