Used AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT E6607B #9243912 for sale

AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT E6607B is a powerful electronic test equipment ideally suited for a wide range of applications in the electronics and electrical industries. It is a programmable instrument designed to provide accurate and reliable measurements of AC and DC signals. It offers an ideal platform for high accuracy, fast analog and digital measurement and analysis. HP E6607B includes 16 bit analog-to-digital and digital-to-analog converters, advanced digital signal processing, integrated software, and various connectors for external signal delivery. The sampling rate is adjustable from a minimum of 10 MS/s to a maximum of 10 GS/s, and the measurement resolution is 0.0003 dB. The built-in filters enables the unit to reject unwanted noise and signal distortion. AGILENT E6607B is a versatile instrument offering a comprehensive measurement set including frequency, amplitude, modulation, and time domain analysis. Advanced signal analysis features such as time alignment, arbitrary waveform generation, signal filtering and signal variance analysis are also available. The unit supports a wide range of signal bandwidths including RF signal bandwidths up to 10 MHz, and audio signal bandwidth up to 20 kHz. A built-in 32 channel oscilloscope allows multiple signal analysis and comparison in the same operation, with flexible cursors in all X- and Y-axes. The user-friendly menus provide easy access to all features and instruments, while the External control interface allows connection with other devices. E6607B also includes various graphical displays such as Smith Charts, XY/Lissajous plots, and histograms for visual analysis. The unit is highly accurate and repeatable, with a Tolerance Matching of 0.007 dB and a wide temperature operating range. Its advanced circuitry and shielding technology ensure optimal operation even in high RF/EMI environments. All these features make KEYSIGHT E6607B the ideal choice for a variety of applications, such as test and development, laboratory measurements, system identification, communication systems, and embedded systems.