Used AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT E9326A #9169891 for sale

AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT E9326A
ID: 9169891
RF Power meter Peak & average power sensor, 50MHz-18GHz.
AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT E9326A is an electronic test equipment from HP range, designed to deliver accurate power measurement and analysis on devices operating in the broadband, digital, and RF/microwave frequency bands. HP E9326A provides testing and measurement capabilities for a variety of applications. It offers an easy-to-use, highly reliable, and upgradeable platform with a wide range of interchangeable measurement assemblies, such as sources, network analyzers, and amplifiers. The equipment is capable of operation over the 4Hz-62GHz frequency range and can measure 100kHz-6GHz with precision. The system is equipped with an integrated 53MHz/64-bit digital signal processor (DSP) and faster embedded measurement software. With its 8-channel GbE (gigabit Ethernet) capabilities and 4-channel 34-bit analog converter it has been designed to reduce test times and simplify test operations. It has a 3-slot architecture which allows users to customize AGILENT E9326A to their specific requirements. The unit includes a variety of measurement assemblies and probes that are designed to simplify manual and automated test operations. The machine has an integrated sequencer that can store up to 80,000 steps and includes complete multi-instrument support, allowing users to control and interconnect multiple instruments. In addition, the tool has a range of graphical user interfaces, including on-board displays, to fit a range of requirements, and a range of device drivers to enable operation with various third-party software. KEYSIGHT E9326A is suitable for a range of applications in the fields of analog, digital, and RF/microwave systems. It is ideal for applications such as signal integrity testing, EMC/EMI analysis, source-pull/load-pull measurements, and RF component and sub-asset testing. It has been designed for use in test environments where it can improve efficiency, reduce costs, and increase throughput.
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