Used AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT N5445A #9165152 for sale

AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT N5445A is an Electronic Test Equipment (ETE) designed to address the rapidly changing requirements of digital and analog testing. It is a portable, easy-to-use solution for characterizing electrical characteristics of devices such as integrated circuits (ICs), discrete components, and other components that need to be tested over a wide range of frequencies and operational conditions. HP N5445A contains a range of features to enable the user to carry out accurate and precise measurements. These include an oscilloscope, network analyzer, logic analyzer, and signal generator. The device has a wide range of probes available for measuring a variety of signals, such as voltage, current, capacitance, resistance, inductance, and frequency. It also has an optional internal signal generator, allowing multiple signals of varying frequencies and waveforms to be tested simultaneously. The device operates with a resolution of 8-bit and has bandwidths of 3MHz to 3GHz, making it ideal for testing digital systems and frequency-dependent components. It has a high-accuracy input range of +/- 3 volts full scale and is capable of measuring frequencies from 0.1 Hz up to 10GHz. Furthermore, AGILENT N5445A has a repetitive noise rejection rate of more than 90dB, making it suitable for tests that require high-precision accuracy. N5445A is also equipped with a variety of automated measurement functions including auto-calibration, auto-sweep, auto-phase, and auto-zero capabilities to make testing quicker and more efficient. Additionally, the device has an adjustable trigger delay and pre-trigger level, enabling precise timing of the measurement window. The device also features multiple timers which can be synchronized and allows for the automated capture of multiple events. KEYSIGHT N5445A is a versatile and powerful ETE that offers a wide range of measurement capabilities. It is ideal for characterizing electrical characteristics of devices such as ICs, discrete components, and other components that need to be tested over a wide range of operational conditions. The device's combination of automated measurement functions and adjustable parameters make it suitable for a wide range of testing activities, including research and development, manufacturing, service, and maintenance.