Used AMAT / APPLIED MATERIALS Vision V80 #9268019 for sale

AMAT / APPLIED MATERIALS Vision V80
ID: 9268019
System Process: Implant high c.
AMAT / APPLIED MATERIALS Vision V80 is an advanced, high-speed electronic test equipment (ETE) used for probing, testing, and analyzing integrated circuits (ICs). It is capable of performing a wide range of automated measurements such as various current/voltage measurements, functional testing, short/open-circuit test, and device-level characterization. In terms of design, AMAT Vision V80 is an 8-channel device with the mainframe featuring a robotic system that can independently control each of the modules. There is a color touch-screen display that allows for easy use and programmability, while several key functions are centralized into a front-panel control area for easy access. APPLIED MATERIALS Vision V80 features a wide range of automated test capabilities, including AC/DC current/voltage, capacitance, power, and temperature patterns. It also features built-in advanced features such as Automatic Measurement, Edge Detection, and Pre-scanning, which allow it to detect and analyze various conditions during device testing. The device also offers multiple memory banks for storing up to 128 different test settings. For functional testing, Vision V80 is capable of testing multiple-level integrated circuits with complex thermal and electrical characteristics. It has a high-speed capture rate of up to 2-Mbits per second, which allows it to separately measure and analyze signals at the device level. Additionally, its integrated power supply provides the necessary power for a variety of testing scenarios. In addition, AMAT / APPLIED MATERIALS Vision V80 also has several safety features such as over-voltage protection and locked-in outputs to ensure the safety of the user and the device during testing. It is also certified to meet all International safety standards, making it suitable for use in industrial environments. Overall, AMAT Vision V80 is an excellent and versatile ETE suite for probing, testing, and analyzing a variety of ICs. It offers high-speed testing capabilities, automated functional testing, built-in safety features, and a centralized user-friendly interface for ease of use. The device is suitable for use in a variety of industrial and research-level testing environments.
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