Used AMPLIFIER RESEARCH PM 2002 #9201607 for sale

AMPLIFIER RESEARCH PM 2002
ID: 9201607
RF Power meter Frequency: 10 KHz - 40 GHz.
AMPLIFIER RESEARCH PM 2002 is a powerful electronic test instrument designed to help engineers measure the output and linearity of a wide range of amplifiers, power supplies, and other high power devices. This electronic test equipment is easy to use, highly accurate, and can provide repeatable results for a variety of applications. PM 2002 utilizes a built-in power meter and can accurately measure the output power of a device under test. It also includes an advanced linearity tester to measure the linearity of the device's output. This feature is especially beneficial for gauging the effectiveness of amplifier designs. AMPLIFIER RESEARCH PM 2002's integrated digital filter helps to eliminate noise and other unwanted signals, providing a more accurate measurement of the device's output. PM 2002 also has several unique features to make testing simpler and more efficient. For instance, it has voltage and current probes that make setting up and measuring a device under test a breeze. A voltage clamp can also be used to measure the current draw of a device. In addition, AMPLIFIER RESEARCH PM 2002 includes an onboard memory allowing users to store up to 32 test settings for fast access. PM 2002 has a wide range of control options that make it suitable for a variety of testing applications. Its built-in amplifier control software lets the instrument react to the device under test and adjust its parameters accordingly. It also includes an AC input and two digital outputs that can be used to remotely control external test equipment. AMPLIFIER RESEARCH PM 2002 is a powerful electronic test equipment for measuring the performance of amplifiers, power supplies, and other high power devices. It is easy to use, highly reliable, and comes with a range of control functions that allow users to adjust it to meet their specific testing needs. With its wide range of features, PM 2002 provides the capabilities necessary to assess the performance of micro-electronic devices and high power systems.
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