Used ANDO AP-9460B #173445 for sale

ANDO AP-9460B is an advanced electronic test equipment specifically designed for the measurement of advanced device performance. It is capable of testing and characterizing a full range of semiconductor devices from linear to non-linear applications in either static or dynamic environments. The test equipment incorporates three primary components: a probe, a test platform, and a measurement system. The probe is used for bringing the device under test in connection with the unit. It is typically a shielded pair of leads that are connected to the device pins. The test platform is a high accuracy, digital instrumentation machine that provides an interface between the device, the probe and the measurement tool. It performs measurements of voltages and currents between the device pins and can also provide an interface between the device and an external measurement asset. The measurement model, usually a digital oscilloscope, controls the test platform and captures data from the device under test. AP-9460B provides a wide range of measurement functions and options. It is capable of testing linear and digital devices, especially in static applications, by measuring device parameters such as bias current, leakage current, capacitance, switching times, delay times and power dissipation at multiple operating conditions. For dynamic applications, the equipment can be used to measure device switching performance, propagation delays, ringing dynamics, and other related device characteristics. The system can be operated manually or automated for ease of use. ANDO AP-9460B is also equipped with several additional features for advanced testing capabilities. The unit includes a comprehensive library of device models for both static and dynamic operations and can also be connected to an external computer for automated testing routines. Additionally, the machine provides a graphic display for observing the waveforms of device operation and measurements. Overall, AP-9460B offers a comprehensive and advanced solution for testing and characterizing advanced device performance. It provides users with a wide range of features and options for accurate and efficient testing of a variety of devices. The tool is well-suited for both static and dynamic applications and offers a user-friendly interface for both manual and automated operations.