Used ANRITSU MH951A #9110338 for sale

ANRITSU MH951A
ID: 9110338
OTDR.
ANRITSU MH951A is an electronic test equipment designed to measure and analyse physical properties of devices and circuits. It measures high-frequency properties with a 0.1Hz resolution from DC up to 26.5 GHz, making it ideal for wideband and broadband applications. MH951A uses a vector network analyser (VNA) to measure the voltage reflection coefficient (S11), input impedance (Zin), and source power (P1); phase characteristics compatible with the Smith Chart, time domain characteristics, and gain / phase margin analysis. The device has an exceptionally wide dynamic range of up to 110 dB for S11, making it suitable for a wide variety of applications. It utilises a 0.1 Hz IF (Intermediate Frequency) to measure the parameters and provide a wide noise floor, enabling high-precision measurement. ANRITSU MH951A is ideal for measuring high-performance devices, such as devices operating in the GHz range. The analyser has a built-in 3.2-inch LCD colour panel for displaying all the measurement results, and its compact size renders it suitable for field measurements. It can directly handle SiGe (silicon-germanium) active devices and circuits, and has an integral digital signal processor for direct on-board signal processing. MH951A has an in-built automatic controller for controlling the measurement process, which helps eliminate errors associated with manual measurements. It supports remote control using SCPI (Standard Commands for Programmable Instruments), and is LECP (LabVIEW Embedded Computation Platform) capable, which makes it suitable for automated industrial tests. Furthermore, the analyser is equipped with an XTR (External Reference) input port for the use of an external signal source for trigger measurement. As an added measure of reliability, the analyser has a self-diagnosis feature that checks for signal integrity and confirms measurement accuracy prior to every measurement. In conclusion, ANRITSU MH951A offers a wide range of features and robust performance in a compact form factor, making it an ideal choice for high performance electronic device and circuit measurements.
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