Used ANRITSU MP1777A #114822 for sale

ANRITSU MP1777A
ID: 114822
jitter analyzer Includes: Option 02: 2666M/5332M/10664M jitter Option 10: high sensitive input of 0.15 to 1.3 Vp-p.
ANRITSU MP1777A is a multi-purpose electronic test equipment (ETE) designed for the testing and measuring of a wide range of parameters in the development and production of electronic components, systems and sub-systems. MP1777A provides functions such as LCR (Inductance, Capacitance, Resistance) measurement, transistor testing, sophisticated oscilloscope capabilities, communication testing and analysis, as well as data logging. ANRITSU MP1777A offers a variety of measurement capabilities. LCR measurements include Inductance, Capacitance, Resonance frequency, Q (quality factor), Damping coefficient, and diode Test. Measurement parameters are customizable to handle a wide range of frequencies. Its Transistor Testing capabilities allow for measuring the Hfe and Vcb parameters of a circuit. In addition, it has Oscilloscope functionality with maximum bandwidth of 200MHz, 500 μs/div to 0.5 μs/div sweep time, and 5 mV/div to 10 V/div vertical range. The instrument also offers Communication Test feature that supports Bluetooth, ZigBee, NFC, Wi-Fi, RFID and various other communication protocols. It can generate various types of signals for testing communication protocols. It can also analyze the responses, allowing for a thorough examination of the entire protocol. This function is especially useful for validating communication protocols in product development. MP1777A also provides logging capabilities to enable the user to store result data in the internal memory or to a USB drive. This prevents data loss in the event of power failure or instrument switch off. The instrument includes an integrated data analysis module which allows the user to review the results, generate reports, and create complex visualizations. This makes it easier to identify data trends and determine the root cause of test failures or issues. ANRITSU MP1777A also includes various other features such as group scan, processing speed of signals of up to 500MS/s, intelligent scan capability for device verification, a dual channel function for measuring parameters from the two sources. All these capabilities make MP1777A an ideal instrument for electronic component development and production.
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