Used ANRITSU MP534A #9133791 for sale

ANRITSU MP534A
ID: 9133791
Dipole antenna.
ANRITSU MP534A is an advanced electronic test equipment designed to provide comprehensive measurement capabilities for testing and evaluating the electrical characteristics of electrical components and devices. It is commonly used by engineers to characterize and analyze a wide variety of semiconductor devices such as ICs, transistors, and other active devices. MP534A is a compact and lightweight instrument designed for accurate and repeatable measurements. It is equipped with an 8 digit, 6.5 digit digital readout display for an easy, user-friendly, and clear view of information. The instrument is also provided with a number of advanced features, including an auto-ramp capability to set the voltage, current, or resistance accurately, and a continuously adjustable characterizing voltage up to 4V. ANRITSU MP534A has two main measurement capabilities: direct measurement of voltage, current, or resistance, and tension/conduction measurement for MOSFETs. For the direct measurement, the user can easily adjust the measurement range, resolution, and operational mode. For MOSFETs, the instrument provides both source and drain-current measurements, with several user-selectable source/drain currents. MP534A is also provided with reliable and repeatable remote programming capabilities. This allows the user to control and operate the instrument remotely from a computer, making operations faster and more convenient. In addition, ANRITSU MP534A is provided with a 6F22 battery backup, which aids in the reliable operation and memory functions, even in the event of a power outage. The instrument is also designed to be simple and easy to use, with an intuitively designed menu system and clear icons and indicators. Finally, MP534A is a cost-effective and reliable instrument for testing a wide range of electrical components and devices. With its user-friendly design and reliable performance, ANRITSU MP534A is an ideal choice for engineers and technicians to analyze and characterize semiconductor devices.
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