Used ANRITSU MW0972C #9110952 for sale

ID: 9110952
OTDR.
ANRITSU MW0972C Vector Network Analyzer is a portable, high-performance, dual-port VNA instrument used for characterizing the electrical parameters of a device under test (DUT) in the frequency domain. It is used for measuring impedance, S-parameters, insertion loss, return loss, VSWR, isolation, transfer parameters, absolute gain, stability measurements, group delay, and other related response parameters. This vector network analyzer provides exceptional accuracy and repeatability, while also offering high dynamic range and operational stability. MW0972C is equipped with a powerful signal source, a time domain reflectometer (TDR) for measuring the length of cables and boards, a built-in calibration system, and an S-parameter utility software. It provides reliable performance in a variety of network analysis applications, quickly detecting changes in DUTs S-parameters. The instrument provides a data display in both Smith chart and tabular formats with 400 points of testing data stored in up to 400 separate memories. ANRITSU MW0972C Vector Network Analyzer has a trace noise of ≤0.09 dB (SSB) and dynamic range of ≥110 dB. It has an internal frequency range of up to 18 GHz (with a high frequency option) and enables relative testing over a frequency range of 1 kHz to 18 GHz. The analyzer is operated either through the graphical user interface (GUI) on the front panel of the instrument or remotely via a private Ethernet connection. All parameters of the DUT can be controlled and measured in real time, allowing the user to change the configuration rapidly and accurately. The analyser boasts superior flexibility, speed, and performance, making it an ideal choice for various network analysis tasks. It provides excellent measurement speed, even at high frequencies. It also provides the user with a wide selection of analysis utilities, including a TDR and a feature-rich arbitrary waveform generator. MW0972C Vector Network Analyzer is a reliable and cost-effective solution for RF component design, production testing, and system characterization.
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