Used ASE AMV 1000-SMT #9231920 for sale

ASE AMV 1000-SMT is an advanced electronic test equipment used in production testing, research, and development. This compact test and measurement equipment integrates a wide range of capabilities and technologies to implement functions such as measuring signal parameters, thermal impedance, and power dissipation. AMV 1000-SMT consists of two modules - a processor and a test bed. The processor utilizes a single-core, 32-bit ARM processor providing fast control and powerful data acquisition. The test bed serves as an interface between the processor and the test subjects. It is outfitted with ten potentiometers, a four- pole banana jack, and three bi-directional switching terminals for individual channel inputs. The test bed can be configured to use a variety of test procedures, depending on the test requirements. ASE AMV 1000-SMT can measure a variety of electrical characteristics. For DC measurements, it can measure voltage, current, capacitance, resistance, and inductance. For AC performance measurements, this test system is capable of measuring frequency, phase, and power. It also has the capability to measure temperature, resistance, and inductance using a temperature probe. The unit also includes digital signal processing (DSP) functions, which allow for fast performance. AMV 1000-SMT is equipped with an 8-bit ADC/DAC machine that provides a wide dynamic range of input signals. These signals can be easily monitored through a variety of visual and audible displays. To ensure accuracy, ASE AMV 1000-SMT is designed with a number of features. The Automatic Range Selection (ARS) feature helps to optimize the readings for different parameters and measurements. It also has a circuitry which can provide warning and shutdown indications when it detects a potentially overheating component. Overall, AMV 1000-SMT is a powerful and versatile test and measurement tool. It is ideal for use in production testing, research, and development and provides accurate readings for a variety of parameters and measurements.