Used BRUKER / JORDAN VALLEY BedeMetrix-F #9314951 for sale

BRUKER / JORDAN VALLEY BedeMetrix-F is a high-performance, multi-application electronic test equipment. Designed by BRUKER and JORDAN VALLEY, this tool is capable of a wide spectrum of market-leading semiconductor and integrated circuit (IC) testing. BRUKER BedeMetrix-F is a versatile device, capable of on-wafer, packaged device, or system validation testing. It features four layers of dedicated instrumentation, with maximum input power and superb measurement accuracy. This allows for faster and more reliable testing capabilities. At the first stage, JORDAN VALLEY BedeMetrix-F offers high-speed scan mode, which can be used to measure the propagation delay of signals and to measure clock accuracy. In addition, it can characterize the power and bandwidth of a given device. The second stage of the instrumentation provides the ability to measure the linearity of an IC's output signal, examine its stability, and gain a better understanding of the device's dynamic performance. This includes dynamic frequency response, gain linearity, output dynamic range, and slew rate, among other metrics. The third layer of BedeMetrix-F supports elastic-tire analysis, allowing users to take accurate measurements of signal integrity. This includes jitter, ringing, capacitance, and impedance. The fourth layer of instrumentation offers full- Chip analog-to-digital conversion (ADC) testing, allowing for accurate and validated low-power and high-speed test results. Overall, BRUKER / JORDAN VALLEY BedeMetrix-F is an extremely valuable piece of test equipment, providing users with a vast array of features and capabilities. It offers a range of levels of instrumentation and relies on multiple layers for accuracy and trustworthiness. With its speed, accuracy, and reliability, users can confidently trust their testing and data.