Used CHANG-YU H361 #293664745 for sale

ID: 293664745
LED Automatic test sorter.
CHANG-YU H361 is a high-end electronic test equipment specifically designed to measure the physical parameters of electronic components and components in the circuit, such as semiconductor devices and crystals. The device comes equipped with comprehensive measuring functions and advanced industrial-grade electric measuring components to offer accurate, reliable and fast test results. It is suitable for a wide range of applications in different fields, such as research and development, test and measurement, manufacturing test, educational research, and semiconductor maintenance and debugging. H361 has comprehensive measurement capabilities, including general parameter measurements, signal measuring functions, and pulse characteristics and other high-speed circuit testing capabilities. It is equipped with a wide variety of connectors that can be used to measure various types of semiconductor devices. In addition, it has an integrated signal generator that is capable of generating a wide range of pulse and signal characteristics in order to analyze device testing. The testing accuracy of CHANG-YU H361 is 0.01% for DC voltage, and 0.5% for resistance, making it an ideal choice for testing semiconductor devices. The device is also designed with a 4-line illuminated display for clearly arranged user interface. The device can measure up to 6 parameters simultaneously with its 6-controller design. In addition, it is equipped with an waveform output port for external modules. H361 also comes with a powerful software package that allows users to view, analyze, and process measurement data, as well as to store and print measurement reports. The package includes a comprehensive range of measurement modes and report formats to meet various measurement tasks. Overall, CHANG-YU H361 is an excellent testing tool for a wide variety of different applications. It is highly reliable, accurate, and efficient, and it has an easy-to-use user interface. The device is especially suitable for testing semiconductor devices and components in the circuit, and it also offers robust software for viewing and processing measured data for further analysis.
There are no reviews yet