Tester
Test rate: 50 MHz
Pin channel: 256 Pins (192 Standard)
Pattern memory: 4M
Parallel testing: 16-32 DUT
EPA: ± 625ps
Resource per pin architecture
DPS (PREF): 8-32
PMU: 16-32
PPMU
Programmable load: ± 35 mA
Operating system: Windows XP.
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