Used CHROMA 58173 #293654944 for sale
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CHROMA 58173 is a highly advanced electronic test equipment designed to test weak DC current, low resistance and switching characteristics of electronic components. It features a high accuracy, wide dynamic range, and fast throughput with precision measurements. The instrument is well suited for characterization and measurement of low resistance components such as resistors, fuses, switches, and other components found in many modern electronic circuits. 58173 consists of a mainframe and a multiplexer module. The mainframe contains the power supply, voltage source, and measurement source. The multiplexer module consists of a Automated precision measurement system (APMK) which includes multi channel folding gain, low pass filters, and multiplexers. The APMK has a DC voltage source, current source, and resistance measurement capabilities from 0.01 μΩ to 1000 mΩ and has maximum resolution of 0.02 μΩ. It also features adjustable test speed, settling times, and integration/accumulation times up to 64 sweeps. CHROMA 58173 can perform automated tests on four ports at once, allowing for testing of up to four different components per measurement cycle. The instrument also has a built-in thermal detector to protect sensitive components from overheating during testing. 58173 also features optional advanced software programs such as contact resistance analysis and parameter characterization. The contact resistance analysis feature allows for contact resistance to be measured at any frequency up to 1MHz and can provide information on contact behavior related to the physical contacts under test. The parameter characterization software can be used to characterize high speed, high voltage, and high current components and can be customized for various conditions, such as temperature and operating mode. Overall, CHROMA 58173 is a highly advanced electronic test equipment and is great for comprehensive evaluation of chip components and circuits. The instrument offers precise, rapid, and accurate test results, making it suitable for almost any environment and application.
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