Used DAIHEN ATP-10A1 #9026661 for sale
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DAIHEN ATP-10A1 is an electric test equipment designed to offer enhanced automation, improved test accuracy and faster testing speeds in a compact, cost-effective package. It is suitable for a wide range of applications in different industries, including consumer electronics, automotive, aerospace and industrial process control. ATP-10A1 features a full 10A output capacity, enabling it to accurately and quickly measure and analyze voltages from 0 to 440V. An automated DC test voltage setting and adjustment feature ensures that precise readings can be taken in order to detect any discrepancies. The ergonomic design of the equipment ensures it is easy to operate, while a high-temperature resistance allows for long-term use. DAIHEN ATP-10A1 also features a wide range of advanced functions, which can help streamline test processes and enable engineers to quickly detect and rectify any issues. This includes a source/measure unit with optional external kelvin sensing for high accuracy, as well as a fast-response, high-speed, high-resolution analog-to-digital converter for accurate digital measurements. A built-in sequence controller makes it possible to easily and quickly execute various types of tests, including continuous, loop and series tests. Its relay control feature ensures that tests can be triggered remotely, while its parameter setting and monitoring add additional flexibility. In addition, ATP-10A1 also includes power management features, allowing engineers to easily monitor power consumption and optimize testing processes. Furthermore, the instrument is compliant with various international safety standards, including CE, UL and CSA, thus helping reduce the risk of electrical hazards. Overall, DAIHEN ATP-10A1 is an ideal test tool for engineers who require accurate, automated and reliable test results. Its wide range of features, reliability and safety compliance make it suitable for a broad range of applications, providing a cost-efficient solution for improved accuracy and increased testing efficiency.
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