Used EIP 575B #9043232 for sale

EIP 575B is an electronic test equipment developed by Electronic Instrument Products (EIP). It is a versatile, multi-function instrument designed for general purpose automated testing and performance measurement. This instrument is capable of performing wide range of measurements including, but not limited to, frequency, period, voltage, time and temperature. 575B utilizes a dual microprocessor system to deliver high-performance, accurate, reliable results for automated functionality. The built-in instrument control software allows the user to easily configure the device to tailor specific test situations and results. The instrument is able to simulate mechanical systems and features such as pulsed amplifier output, switch matrix output, delayed trigger output, and voltage ramp modulation. EIP 575B includes a large variety of test tools in order to meet a variety of applications. These tools include a selection of frequency counters, dual source multimeters, and six-channel scalers. Additionally, a large variety of analog, digital, and special purpose instruments are available for use with EIP. The device also features a number of onboard Programmable Logic Controllers (PLC) which allows for the use of advanced algorithms and sequencing. Additionally, the integrated user-definable Markers, which allow the user to control the display of results, enable the user to quickly and easily obtain the desired result from the instrument. The accuracy and response of 575B has been further enhanced by the addition of a noise filter, which eliminates the majority of induced noise that can be caused by outside sources. Furthermore, all measurements taken by the instrument can be transferred to a PC via a USB or IEEE 485 connections. Overall, EIP 575B provides an advanced, all-in-one solution for electronic test and measurement. It is suitable for use in both laboratory and industrial environments, and is a perfect choice for automated testing. With its numerous features, it is an ideal tool to help streamline test processes and increase the efficiency of test systems.