Used ENI 3100LA #9105393 for sale

Manufacturer
ENI
Model
3100LA
ID: 9105393
Amplifier Instantaneous Bandwidth Forced-Air Cooling Solid-State Reliability.
ENI 3100LA RF test equipment provides highly accurate and reliable S-parameter and time domain measurements over a wide frequency range from 250 kHz to 150 GHz. The system is based on a solid-state vector network analyzer (VNA) optimized for high sensitivity and low-noise performance. 3100LA is designed to be a comprehensive device for RF and microwave measurements that can be easily integrated into test systems for signal modulation, scattering parameter, and gain/loss measurements. The unit includes a high-performance digitizer and a receiver, along with a software suite for data acquisition and analysis. ENI 3100LA VNA offers extremely high frequency resolution, making it ideal for characterizing complex components such as power amplifiers at very high frequencies. The machine includes a wide selection of 2-port and 4-port calibration standards, allowing for accurate and precise measurements of a variety of components. 3100LA also features wide dynamic range, low insertion loss, and a wide frequency range that makes it ideal for characterizing amplifiers, filters, antennas, and other components. The embedded software suite includes VectorVu software, an advanced graphical user interface for mainframe control and signal analysis. Users can easily configure and monitor wideband RF measurements with the software. The software also offers a selection of powerful analysis tools, allowing users to quickly characterize and evaluate components in the frequency or time domain. ENI 3100LA is suitable for a variety of applications in research, development, production, and service. Its ability to utilize a wide selection of options, such as a rotating head and extended frequency range, makes it ideal for a variety of different tests. In addition, 3100LA's powerful software suite allows engineers to easily set up and configure tests. As a result, the tool can easily be integrated into existing test systems.
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