Used FURUKAWA S175 #9105842 for sale

Name: FURUKAWA S175
Brand: FURUKAWA
SKU: 9105842
Availability: InStock

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Electronic Test Equipment

Manufacturer

FURUKAWA

Model

S175

ID: 9105842

Splicer Silica glass based optical SM / MM/ DSF fibers Coating / Clad Dia: 0.25-0.9mm / 0.1-0.15mm Cleave Length: standard 16mm optional 10mm Average loss:SM: 0.02dB MM: 0.01dB DS: 0.04dB(with identical Furukawa fibers) Reflection: -60dB or lower Estimation accuracy: +/- 0.05dB (loss <0.4dB), +/- 15% (loss>0.4dB) Operating time: Splice: 20s (typical),Heat: 90s (typical for S921) Tension test: 200g (0.4lbs), option 440g (0.9lbs) Attenuation splice: 0 to 10 db by 0.1 db 32 Splice Program with one Auto splice mode 4 pre-programmed. 28 customisable Inspection: Cleave angle, Fibre end gap, core eccentricity, offset, tilt, micro bending, Bubble at spliced point Display information: operating message, ARC counter, clock, heater status, estimation loss, finder image X Y view.

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FURUKAWA S175 is a high-performance electronic test equipment developed by FURUKAWA Electric Co. Ltd. This electronic testing equipment enables engineers and technicians to quickly and accurately evaluate a device's parameters. S175 is a highly advanced testing system capable of delivering simultaneous testing in multiple test systems. This allows the unit to take numerous readings of the same device over varying parameters. This reduces the need for costly replacements, as more accurate readings can be taken at lower cost. FURUKAWA S175 comes with a range of measurement and control features. Its operator interface offers a user friendly experience when navigating the menu options. These features are useful for complex testing procedures, such as those required for semiconductor device testing. S175 is designed with integrated powerful computing, enabling the testing to be performed quickly and efficiently. The automated analysis and display of results reduce the manual effort required, allowing greater efficiency in both test analysis and debugging. This makes it ideal for use in automated production lines, as well as in research and development. FURUKAWA S175 incorporates a variety of output ports, including digital and analog, allowing it to be easily connected to many different types of device under test. This also allows different types of test data to be collected, stored and analyzed concurrently. For example, S175 is able to track and store cross-cut data, such as timing or signal characteristics, giving the tester a much more detailed understanding of the device's performance. FURUKAWA S175 also offers a selection of triggering options, allowing the user to define the conditions that will initiate the testing procedure. This gives the user great control over the testing process so that tests are performed as efficiently as possible. S175 has been designed to meet the toughest standards of the electronics industry, ensuring that it is reliable for all types of testing. This test machine is also lightweight and highly portable, making it ideal for use on the move. Overall, FURUKAWA S175 is an excellent choice for any engineer or technician needing a comprehensive test tool for electronic device evaluation.