Used HIOKI 8973 #9164003 for sale

HIOKI 8973
Manufacturer
HIOKI
Model
8973
ID: 9164003
Memory hicorder.
HIOKI 8973 is an advanced electronic test equipment enabling effective test and measurement of signals and power. Designed for high accuracy and versatility, 8973 is suitable for analyzing just about anything related to a variety of measurement and testing needs. HIOKI 8973 comes with four measurement modes - Voltage Sourcing, Voltage/Current Measurement, Impedance Measurement, and Voltage/Current Scanning - and can be used to measure DC and AC values of either voltage or current. A 200MS/s sampling rate and 12-bit resolution allow the user to capture and analyze signals with precision and accuracy. Various features included in 8973 make its use even more efficient. Low Duty Mode reduces the duty cycle to 0.001% to minimize test time and extend the life of the test lead. Pre-Amp Mode amplifies a small signal up to 5 times to measure micro level signals and Drive Mode allows the user to drive signals from 0V to 10V when sourcing signals. HIOKI 8973 also comes with Data Logging/List Mode, Continuous/Burst Mode and Memory Function Modes, allowing the user to record, store, and analyze data according to their test and measurement needs. The unit also has Compliance Curves, showing the current status of the measurement points according to the standard values to provide quick insight into the results. This powerful device also comes with LCD, Local & Remote mode, Program Mode, and a choice of Voltage, Current or Resistance measurement, enabling the user to both view and store data without having to connect to any other device. A 10-key keypad, menus and soft keys make testing simple and less time-consuming. It also includes a USB interface port, which can be used to transfer results and settings data to a PC. Overall, 8973 is a reliable, user-friendly and versatile electronic test equipment for a variety of testing needs. Its intuitive and accurate measurements and features make it an ideal choice for both industrial and research settings.
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