Used JUPITER BLACK STAR 2010 #123204 for sale

JUPITER BLACK STAR 2010 is a versatile and reliable electronic test equipment package manufactured by Omron. This product is ideal for professionals engaged in servicing, evaluating, and troubleshooting electronics and digital systems. 2010 includes a 10.4-inch screen display, a wired probe, a remote controlunit, and a comprehensive software suite. It is versatile in nature, allowing it to be used for both general electronic and digital system testing. The built-in 10.4-inch display is created to work in any environment, including high-glare sunlight. It also supports high resolution images and a 4:3 aspect ratio. Furthermore, the display is manufactured with an adjustable backlight to optimize usage in both bright and low-lit settings. The included wired test probe is specially designed to receive signals from digital electronic systems, providing precise readouts for multiple parameters. The probe is further equipped with a wide range of signal inputs ranging from AC to DC, as well as providing high frequency signal measurements and sampling. JUPITER BLACK STAR 2010 also includes adetachable battery-powered remote controlunit. This control unit enables technicians to operate the unit from a safe distance while maintainingaccurate readings and measurements. Furthermore, there is a series of leds that indicate power status, connection, and operation status. The comprehensive software suite also comes standard with 2010. This bundle includes a variety of different diagnostic and troubleshooting programs, allowing for easy data analysis, logging, and reports. Additionally, the suite is compatible with both Windows and Mac operating systems, making it easy to use in a variety of different scenarios. JUPITER BLACK STAR 2010 offers reliable and versatile electronic test equipment that is ideal for professionals involved in electronic and digital system servicing. Its comprehensive software suite, adjustable display backlight, wireless probe, and remote controlunit all provide the ideal combination of features necessary for accurate and efficient troubleshooting and diagnosis of digital systems.