Used KEITHLEY 0660909 #9312848 for sale

KEITHLEY 0660909 is electronic test equipment used for performing automated multiple-site testing of integrated circuits. It is a multi-channel tester capable of testing up to 16 sites simultaneously over a range of temperatures. Its design allows it to control two different outputs, one for VWDM (Voltage-Wattage-Duration-Measurement) and one for SDRM (Slow-Data-Rate-Measurement). Its dual measurement capabilities enable it to characterize integrated circuits, such as power management ICs or system-on-chip devices, at a single site or across multiple sites. 0660909 features a dual-channel, 64-bit architecture, with each channel running at 100 Mega Samples per second and 16 K memory depth. It offers a wide range of test functions, with an integrated 8th order Butterworth high-pass filter and a steady-state stimulation waveform. The tester also has several output settings including DC, AC, and Pulse. It is capable of generating multiple waveforms, at varying amplitudes and frequencies, using path filtering, AC-coupled AC-signals, high speed data, and other advanced features. KEITHLEY 0660909 tester includes an easy to use Graphical User Interface (GUI), supporting command scripting and a variety of modular instruments. It provides comprehensive graphical and interactive displays with limitless views. With its advanced multiple-site testing capabilities, it also offers deep memory per site which enables users to store up to 16K of memory per site and perform multiple measurements on a single test sample. 0660909 tester comes with several features and capabilities, offering both ease of use and high performance. It is capable of achieving high levels of accuracy and repeatability. This tester provides a range of test capabilities suitable for testing both low pin-count and high pin-count devices with its variety of measurement options. It is a versatile solution for integrated circuit testing, offering both performance and flexibility. With its range of test capabilities, it is ideal for applications such as design verification, failure analysis, product development, and manufacturing test. Its advanced multi-site testing capabilities make it a powerful solution for testing a range of integrated circuit types.