Used KEITHLEY 2420 #9165278 for sale

KEITHLEY 2420 is an innovative source measure unit (SMU) instrument that provides precision voltage and current sourcing, measurement, and profiling of up to two channels at the same time with high-speed performance. It is designed to be an effective and accurate solution for test and data analysis applications in production testing and research and development. 2420 is comprised of a mainframe and two interchangeable source measure units, enabling two channels of operation. The instrument offers an integrated 10.4" touch screen for quick setup and data review and the values displayed can be switched between points or time. It also enables remote control via GPIB, RS-232, Ethernet, or USB interfaces, making it convenient to integrate into automated test systems. The instrument has a wide measurement range extending from 10 nA to 10 A, 1 µV to 1V, 0.01 Ohms to 1 MOhms with excellent accuracy (a typical accuracy of 0.1%) and fast transient response. It also has dynamic impedance measurements with a round off noise of 10 µVrms and a signal-to-noise ratio of greater than 140dB. There's also built-in pulse capability and frequency response option to measure devices that have dynamic impedance characteristics. KEITHLEY 2420 is ideal for applications such as material characterization under changing stress, voltage-current-temperature tests, power device testing, impedance measurement, gain bandwidth testing and much more. It also works well for automated, high-speed applications such as production testing because of its ability to quickly collect and analyze data readings. 2420 is an invaluable tool for both low-level and large-scale testing and analysis needs due to its ease of use, accurate readings, flexibility, and reliable performance. It also comes with various accessories and options that enable users to configure the instrument according to their specific testing needs. Furthermore, safety features are in built, to ensure lab personnel safety and to protect the instrument and the devices being tested.