Used KEITHLEY 2602B #293592251 for sale

KEITHLEY 2602B is a precision, high-performing SMU (Source Measure Unit) instrument with the capabilities of a DC power supply, electrometer and data acquisition system. KEITHLEY 2602 B offers superior measurement accuracy and resolution with an ease of use and convenience that only KEITHLEY brand can provide. With the power of 2602B, users can outperform other SMU instruments in virtually any application up to 20 W on either voltage or current. 2602 B features a built-in 5-1/2 digit true-RMS-reading DMM that is designed to bring a comprehensive range of measurement capabilities to customers. With true RMS capability, KEITHLEY 2602B provides the best possible performance for AC signals, regardless of shape or size. For example, KEITHLEY 2602 B can measure small AC signals such as 0 to 400 mV or large signals in excess of 400 VAC with precision and performance. 2602B also includes a modular measurement library that includes 32 built-in functions to enhance capabilities across a variety of testing scenarios. For example, 2602 B is capable of simultaneously sourcing and measuring current and voltage, as well as temperature and any current or voltage ratio, with high accuracy and precision. For pulse testing, KEITHLEY 2602B can generate and measure either single or burst signals with completely programmable pulse parameters. In addition, KEITHLEY 2602 B includes numerous interfaces, including USB, Ethernet and GPIB. This wide range of I/O abilities allows it to be easily integrated into any test environment. The included LabVIEW-compatible software is also an included feature, allowing users to create automated tests with ease. 2602B is a must-have tool for engineers, technicians and other members of the high-performance testing market. With an exceptional combination of accuracy, resolution and ease of use, 2602 B is the ultimate high-performance SMU instrument. Guaranteed to deliver results faster and with greater accuracy, KEITHLEY 2602B will save users time and money by providing faster test times and reliable measurements in virtually any application.