Used KEITHLEY 4200-SCS/F #293645286 for sale

KEITHLEY 4200-SCS/F is an ultra-high precision semiconductor parameter analyzer from KEITHLEY, the world premiere instrumentation solutions provider. It offers a feature-rich, precision measurement solution for semiconductor and device characterization. KEITHLEY 4200 SCS/F is designed to measure extremely low levels of current, resistance, and voltage with high accuracy and accuracy. The equipment provides a wide dynamic range of current and voltage measurements, ranging from nano-amps to hundreds of millivolts, and offers unparalleled sensitivity in both voltage and current measurements. Its advanced motion control and measurement subsystem allows it to accurately characterize devices with very small sizes and high speed without disturbing adjacent signal lines. 4200 SCS / F features SmartTest Technology, which allows the system to measure and compare quickly and accurately while allowing the user to define test limits which the unit can analyze to find device irregularities, anomalous data points, and potential device failures. SmartTest also allows for advanced geometries for test projects, such as characterizing interdigitated capacitors and high-speed dynamic threshold tests on advanced, next-generation devices. 4200-SCS/F is capable of performing IV and CV measurements in both forward and reverse biases with multiplexed or dynamic current source capabilities. It also provides source measurement unit (SMU) sweeps for relative measurements between different channels and stages, with fast DC and AC sweep functions. KEITHLEY 4200 SCS / F is the ideal solution for semiconductor research and production test applications, providing precision measurements and comprehensive control over device characterization. It includes both a contact checker tester and an open-contact test probe, both of which measure and monitor contact resistance throughout the contact process. The machine also includes an intuitive graphical user interface (GUI) and a variety of tool level options to make 4200 SCS/F a highly functional, efficient, and easy to use asset. It is user-friendly and flexible enough to be used in a variety of applications ranging from simple single device characterization to complex precision characterization and testing. KEITHLEY 4200-SCS/F's intuitive design, impressive performance and feature set, and advanced testing capabilities make it the ideal instrument for semiconductor production, research and characterization testing.