Used KEITHLEY 4200-SCS/F #293645288 for sale

KEITHLEY 4200-SCS/F is an electronic test equipment that initiates, performs, and automates the testing of semiconductor wafers and devices such as diodes, transistors, capacitors, inductors, and resistors. The system is designed to reduce test time and improve yield by performing high-speed testing and cost-effectively integrating multiple technology capabilities into a single platform. The system consists of a Mainframe, a Precision Measurement (PMU), and a Probe Rack. The Mainframe is the command and control center of the system and allows the user to control the instrument via the provided software. It includes a range of features such as: data acquisition, data analysis, pattern generation, hardware debugging, and instrument measurement. The Precision Measurement Unit (PMU) acquires and processes the input from the probes. It provides a wide range of capabilities such as: DC measurements, AC measurements, pulse measurements, digital measurements, dynamic linearity measurements, and noise floor analysis. It also has built-in support for Ethernet, GPIB, and USB interfaces. The Probe Rack stores the probe cards and sensors used for the testing and measurement. It comes with a variety of accessories such as: probe cards, probes, probes stands, sample holders, static wafer handlers, wafer clips, and wafer clamps. KEITHLEY 4200 SCS/F has a powerful automated test flow that allows users to quickly and easily configure their tests. The automated test flow includes a step-by-step guide with diagrams and help files that provide detailed information about the test elements and its properties. The customizable test environment allows users to set up their test conditions quickly, select their desired measurement parameters, and specify their desired test sequence. The results of the tests can be quickly exported to other compatible systems such as databases, spreadsheets, and text files. 4200 SCS / F is ideal for high throughput applications requiring fast, accurate measurements. It has a wide range of applications, including device characterization, parametric, reliability testing, and process qualifications. In addition, it is designed for robustness and performance, making it suitable for all types of semiconductor wafer and device testing.