Used KEITHLEY 4200-SCS/F #293645289 for sale

KEITHLEY 4200-SCS/F is an advanced system-level semiconductor characterization and analysis test solution. This multi-parameter test station features a four-position parametric test station with KEITHLEY 4200 SCS/F capabilities which provides the capability to quickly characterize multiple devices independently in each iteration. This system allows for easy connection to any combination of the various electrical sources, meters, and signal analyzers to provide advanced characterization and analysis of semiconductor devices. It is designed to provide the latest in instrumentation performance with advanced benchtop control and data processing capabilities. This comprehensive solution provides capabilities to measure current-voltage (I-V) and capacitance-voltage (C-V) parameters. It also features high-precision analog and pulse width modulation (PWM) switching and low-level voltage shifting to accurately measure and analyze low-level device parameters. Automatic test sequencing and data acquisition features are also available, which allow engineers to automate the entire testing process. 4200 SCS / F comes with a range of options to easily set up, monitor, and measure multiple devices with ease. These options include high-resolution graphical output and various high-speed analog measurement instruments such as oscilloscopes, spectrum analyzers, and network analyzers. Advanced automation options ensure accurate, repeatable results and minimize setup time. With its Ethernet connectivity, users can easily access and manage test data, share remote controller operations, and export data for any set of conditions. 4200 SCS/F also provides an impressive selection of safety features to ensure a safe and error-free environment. These features include over-voltage protection, adjustable current limiters, and advanced fault protection. Through its user-friendly graphical interface, users can easily monitor test conditions, as well as view live test results and generate reports. Overall, KEITHLEY 4200 SCS / F is an advanced system-level semiconductor characterization and analysis test solution packed with advanced features to simplify testing and improve efficiency. This test station is designed to meet the needs of the modern semiconductor device development and production environment, allowing engineers and technicians to quickly measure and analyze devices with the highest level of accuracy.