Used KEITHLEY 4200-SCS #293749947 for sale

KEITHLEY 4200-SCS is an advanced precision semiconductor characterization system designed for accurate and comprehensive analysis of electrical properties of semiconductor materials. KEITHLEY 4200 SCS provides a wide range of test capabilities and automated measurement procedures, with a customizable user interface. Its powerful architecture combines two precision source/measurement instruments and a PC-based controller, delivering a platform for accurate and consistent device characterization. 4200-SCS includes two SMU SourceMeter® instruments, each offering single- or dual-channel operation. The SourceMeter instruments provide high-bandwidth current and voltage sourcing, simultaneous 4-quadrant operation, and measurement accuracy of up to 300 μV and 0.7 fA resolution. 4200 SCS supports a variety of parameters and testing methods, such as those specified in JEDEC and IEC standards, and features three TempBridge systems for thermal analysis and characterization of thermal transient measurements. The system also supports a wide array of useful automated wafer handlers and sample carriers for wafer and package testing. KEITHLEY 4200-SCS has several software tools to enhance the user's testing capabilities. These tools include a powerful Graphical User Interface for programming and data analysis, KEITHLEY Measurement Manager for creating and executing automated test procedures, and a LabView™ plug-in for creating LabView instruments and applications. To reduce programming efforts and expedite testing, KEITHLEY 4200 SCS includes a library of source-measurement and thermal characterization test sequences. 4200-SCS is a versatile system with a precision design and capabilities to enable accurate and repeatable measurements of electrical parameters. The powerful architecture, advanced software capabilities and automated wafer measures provide a platform capable of a wide range of device characterization.